JOSIE LANE
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CARLA JONES
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AFM, SPM, Nanotechnology, Nanomechanics, Nanoelectrical Characerization, Force Measurements
Oxford Instruments Asylum Research Inc.
US
Oxford Instruments Asylum Research is the technology leader in atomic force microscopy for both materials and bioscience research. Asylum Research AFMs are widely used by both academic and industrial researchers for characterizing samples from diverse fields spanning material science, polymers, thin films, energy research and biophysics.
In addition to routine imaging of sample topography and roughness, Asylum Research AFMs also offer unmatched resolution and quantitative measurement capability for nanoelectrical, nanomechanical and electromechanical characterization. Recent advances have made these measurements far simpler and more automated for increased consistency and productivity.