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Electron Microscopy, Scanning Probe Microscopy, Scanning Electron Microscopy (SEM), Atomic Force Microscopy (AFM), Transmission Electron Microscopy (TEM), Surface Analysis, 3D Optical Microscopy, X-ray Photoelectron Spectrometry, and Focused ion beam (FIB) technology

Systems for Research


SFR is the exclusive distributor in Canada for a select group of premier instrument manufacturers in the fields of nanotechnology, surface characterization and materials analysis.
SFR has a team of 10 Field Service Engineers.
SFR actively partners with Canadian researchers and industrial labs and has been doing so for over 23 years. SFR is proud to collaborate with professional organizations including the CSC (Canadian Society of Chemistry), CAP (Canadian Association of Physicists), and MSC (Microscopy Society of Canada). Our products and services can be found at National Research Centers, Research Hospitals and major universities across Canada.

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