Atomic Force Microscope for SEM/FIB - Quantum Design AFSEM®nano AFM Insert

AFSEM nano is an atomic force microscope (AFM), designed for integration in a SEM or Dualbeam (SEM/FIB) microscope. Its open access design allows you to simultaneously operate SEM and AFM inside the SEM vacuum chamber. The correlated image data of AFM and SEM enable unique characterization of your sample, and the combination of complementary techniques is a key success factor for gaining new insights into the micro and nano worlds. AFSEM nano enables you to easily combine two of the most powerful analysis techniques to greatly extend your correlative microscopy and analysis possibilities.

AFSEM nano lets you simultaneously image your sample with high resolution, create true 3D-topography representations, and accurately measure heights, distances and even material properties, all while maintaining the large SEM field of view to position your AFSEM nano cantilever exactly where you want it. The powerful AFSEM nano control software allows for optimized and intuitive measuring, system handling, and data analysis.

For product or material analysis, it is often desirable to analyze a sample with multiple techniques and look for correlations between parameters. For imaging techniques like SEM and AFM this means one should make sure to analyze the exact same area. What easier way for correlative SEM-AFM analysis than performing the AFM measurement directly inside the SEM?