Park NX-Wafer

Park NX-Wafer is the leading automated AFM system in the semiconductor industry. It offers comprehensive wafer fab inspection, defect review, and CMP profiling. Park NX-Wafer boasts the highest nanoscale surface resolution, consistent sub-angstrom height accuracy, and superior tip sharpness with minimal variation. Its features like auto tip exchange, live monitoring, markless target positioning, and automated analysis, make it a top-tier tool for semiconductor wafer applications.