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Park NX-Wafer

Park Systems

Scanning Probe Microscopy (SPM)

Product Overview

Park NX-Wafer is the leading automated AFM system in the semiconductor industry. It offers comprehensive wafer fab inspection, defect review, and CMP profiling. Park NX-Wafer boasts the highest nanoscale surface resolution, consistent sub-angstrom height accuracy, and superior tip sharpness with minimal variation. Its features like auto tip exchange, live monitoring, markless target positioning, and automated analysis, make it a top-tier tool for semiconductor wafer applications.
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Product Description

Park NX-Wafer is the leading automated AFM system in the semiconductor industry. It offers comprehensive wafer fab inspection, defect review, and CMP profiling. Park NX-Wafer boasts the highest nanoscale surface resolution, consistent sub-angstrom height accuracy, and superior tip sharpness with minimal variation. Its features like auto tip exchange, live monitoring, markless target positioning, and automated analysis, make it a top-tier tool for semiconductor wafer applications.

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Park Systems

Park Systems is a nanotechnology company specializing in advanced measurement solutions for various industries, including semiconductor fabrication and materials science. They offer a range of products such as AFM and ellipsometers, catering to researchers and engineers who require precise measurement tools for nanoscale analysis and quality assurance.

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