Yolande Berta

Senior Research Scientist
Center for Nanostructure Characterization
Office: PT Building 279
Yolande Berta has over 20 years experience in electron microscopy, including both SEM and TEM, and has trained thousands of operators. Ms. Berta has a Master's degree in Science from the School of Materials Science and Engineering, Georgia Institute of Technology and a Master's degree in Biology from the University of Illinois, Champaign-Urbana. This diverse background has ideally positioned her to work with students from all disciplines on campus. Ms. Berta has over 15 peer-reviewed publications, and has given over 15 professional presentations.

Hands-on training in the operation of SEMs and TEMs
Coordinating the use of the instruments for research, training and classes
Providing service and feedback to over 250 users in the Center
Atlanta
USA