Senior Research Scientist
Center for Nanostructure Characterization
Office: PT Building 279
Yolande Berta has over 20 years experience in electron microscopy, including both SEM and TEM, and has trained thousands of operators. Ms. Berta has a Master's degree in Science from the School of Materials Science and Engineering, Georgia Institute of Technology and a Master's degree in Biology from the University of Illinois, Champaign-Urbana. This diverse background has ideally positioned her to work with students from all disciplines on campus. Ms. Berta has over 15 peer-reviewed publications, and has given over 15 professional presentations.
Hands-on training in the operation of SEMs and TEMs
Coordinating the use of the instruments for research, training and classes
Providing service and feedback to over 250 users in the Center