Microscopy and imaging, Sensors, Probes

High Aspect Ratio

NanoWorld AG

Trench MeasurementAR5-NCH• High Aspect Ratio Tip• Aspect Ratio � 5:1• Non-Contact High frequency• C = 42 N/m; fo = 330 kHzAR5T-NCH• High Aspect Ratio Tip• Aspect Ratio � 5:1• Tilt compensation: 13�• Non-Contact High frequency• C = 42 N/m; fo = 330 kHzAR5-NCL• High Aspect Ratio Tip• Aspect Ratio � 5:1• Non-Contact Long cantilever• C = 48 N/m; fo = 190 kHzAR10-NCH• High Aspect Ratio Tip• Aspect Ratio � 10:1• Non-Contact High frequency• C = 42 N/m; fo = 330 kHzAR10T-NCH• High Aspect Ratio Tip• Aspect Ratio � 10:1• Tilt compensation: 13�• Non-Contact High frequency• C = 42 N/m; fo = 330 kHzAR5-NCHR• High Aspect Ratio Tip• Aspect Ratio � 5:1• Non-Contact High frequency• C = 42 N/m; fo = 330 kHz• Backside Reflex coatingAR5-NCLR• High Aspect Ratio Tip• Aspect Ratio � 5:1• Non-Contact Long cantilever• C = 48 N/m; fo = 190 kHz• Backside Reflex coatingAR10-NCHR• High Aspect Ratio Tip• Aspect Ratio � 10:1• Non-Contact High frequency• C = 42 N/m; fo = 330 kHz• Backside Reflex coatingAR10T-NCHR• High Aspect Ratio Tip• Aspect Ratio � 10:1• Tilt compensation: 13�• Non-Contact High frequency• C = 42 N/m; fo = 330 kHz• Backside Reflex coatingAR5T-NCHR• High Aspect Ratio Tip• Aspect Ratio � 5:1• Tilt compensation: 13�• Non-Contact High frequency• C = 42 N/m; fo = 330 kHz• Backside Reflex coating