Microscopy and imaging, Sensors, Probes

Platinum Silicide AFM Probes

NanoWorld AG

Electrostatic Force Microscopy/ Electrical Measurement (EFM)PtSi-NCH• Non-Contact High frequency• C = 42 N/m; fo = 330 kHz• PtSi coated probePtSi-FM• Force Modulation Mode• C = 2.8 N/m; fo = 75 kHz• PtSi coated probePtSi-CONT• Contact Mode• C = 0.2 N/m; fo = 13 kHz• PtSi coated probe