Microscopy and imaging, Sensors, Probes

AdvancedTEC

NanoWorld AG

Electrostatic Force Microscopy/ Electrical Measurement (EFM)ATEC-CONTPt• Advanced Tip at the End of the• Cantilever?• real tip visibility from top• Contact Mode• C = 0.2 N/m; fo = 15 kHz• PtIr5 coated probeATEC-CONTAu• Advanced Tip at the End of the• Cantilever?• real tip visibility from top• Contact Mode• C = 0.2 N/m; fo = 15 kHz• Au coating (both sides)ATEC-NCPt• Advanced Tip at the End of the• Cantilever?• real tip visibility from top• Non-Contact• C = 45 N/m; fo = 335 kHz• PtIr5 coated probeATEC-NCAu• Advanced Tip at the End of the• Cantilever?• real tip visibility from top• Non-Contact• C = 45 N/m; fo = 335 kHz• Au coating (both sides)ATEC-EFM• Advanced Tip at the End of the• Cantilever?• real tip visibility from top• C = 2.8 N/m; fo = 85 kHz• PtIr5 coated probeATEC-FMAu• Advanced Tip at the End of the• Cantilever?• real tip visibility from top• Force Modulation Mode• C = 2.8 N/m; fo = 85 kHz• Au coating (both sides)