Microscopy and imaging, Sensors, Probes

XY-Alignment Compatible SuperSharpSilicon Types

NanoWorld AG

Enhanced Resolution ImagingSSS-NCL• Non-Contact Long cantilever• C = 48 N/m; fo = 190 kHzSSS-SEIH• for Seiko Instruments microscope• C = 15 N/m; fo = 130 kHzSSS-NCLR• Non-Contact Long cantilever• C = 48 N/m; fo = 190 kHz• Backside Reflex coatingSSS-SEIHR• for Seiko Instruments microscope• C = 15 N/m; fo = 130 kHz• Backside Reflex coating