Microscopy and imaging, Sensors, Probes

Plateau Tip

NanoWorld AG

Tipless Cantilever for Probe ModificationPL2-CONT• Contact Mode• C = 0.2 N/m; fo = 13 kHzPL2-NCH• Non-Contact High frequency• C = 42 N/m; fo = 330 kHzPL2-NCL• Non-Contact Long cantilever• C = 48 N/m; fo = 190 kHzPL2-FM• Force Modulation Mode• C = 2.8 N/m; fo = 75 kHzPL2-CONTR• Contact Mode• C = 0.2 N/m; fo = 13 kHz• Backside Reflex coatingPL2-NCHR• Non-Contact High frequency• C = 42 N/m; fo = 330 kHz• Backside Reflex coatingPL2-NCLR• Non-Contact Long cantilever• C = 48 N/m; fo = 190 kHz• Backside Reflex coatingPL2-FMR• Force Modulation Mode• C = 2.8 N/m; fo = 75 kHz• Backside Reflex coating