Microscopy and imaging, Sensors, Probes

Diamond coated

NanoWorld AG

Electrostatic Force Microscopy/ Electrical Measurement (EFM)CDT-NCHR• Non-Contact High frequency• C = 80 N/m; fo = 400 kHz• Backside Reflex coating• Conductive Diamond coated TipCDT-NCLR• Non-Contact Long cantilever• C = 72 N/m; fo = 210 kHz• Backside Reflex coating• Conductive Diamond coated TipCDT-FMR• Force Modulation Mode• C = 6.2 N/m; fo = 105 kHz• Backside Reflex coating• Conductive Diamond coated TipCDT-CONTR• Contact Mode• C = 0.5 N/m; fo = 20 kHz• Backside Reflex coating• Conductive Diamond coated Tip