Characterization, Dendrimers, Fullerenes, Graphene, Material Science, Metrology, Nanomaterials, Nanometrology, Nanoparticles, Quantum Dots, Spectrometers, Spectroscopy, Thin Films, Terahertz multispectral imaging, 3D imaging, Sub-surface, non-destructive

Applied Research & Photonics

USA

Applied Research & Photonics, Inc. (ARP) provides terahertz nano-scanning material characterization testing services and technology to semiconductor and nano-material researchers and manufacturers. Their TeraSpectra Spectrometer is a sub-surface nano-scanner and 3D imager that provide non-contact, non-destructive testing capabilities at ambient temperatures.