By LayTec GmbH
Algo name: NKR adv virtual layer fit Short description: - Analysis method for thick (>1 oscillation period visible) smooth layers of all (even unknown) materials. - No optical properties need to be known. - If available, further knowledge about the material properties can be used for restricting the parameter space. Here, either database values or data from external source can be used. - The analysis will fit refraction index n, extinction coefficient k and growth rate r for reflectance transients obtained by LayTec's EpiCurve® TT and EpiTT. Usage ideas and alternatives: - Analysis of thick smooth layers like e.g. contact layers, buffer layers, etc. - Use this analysis to gain temperature dependent n and k data for unknown materials by fixing the growth rate with thickness information about the layer from ex-situ measurements (e.g. XRD). - For known materials, the multi-wavelength fits offer a faster and more precise analysis (to be covered in future volume of this series).
