By LayTec GmbH
† In contrast to the "NKR adv virtual layer fit" and the "NKR Fit on substrate/calibration-layer-corrected reflectance" algorithm, the "Oscillation-based Growth Rate" fit makes use of the known refractive index n and the extinction coefficient k to deduce the growth rate r during epitaxial growth from reflectance transients obtained by LayTec's EpiTT and EpiCurve® TT. † For detailed growth rate analyses or even unknown materials properties the NKR adv Virtual Layer Fit is usually a better alternative.
