By Wintech Nano-Technology Services Pte. Ltd.
Also known as SAM, this technique uses ultrasound waves to detect delaminations, cracks, voids, or other defects within materials or between layers. Particularly useful for non-destructive testing, SAT is essential for analyzing bonded structures, such as those found in packaged semiconductors or composite materials. The company’s SAT capabilities enable the detection of hidden defects, ensuring the reliability and integrity of complex assemblies.
