By LayTec GmbH
Knowledge is key Our business: Process-integrated optical metrology. Our markets: Semiconductor and thin-film industry & academia incl. lighting, laser, PV, glass coating … Broad spectrum of technologies based on 25 years of in-situ and in-line metrology. Optical methods are ideally suited for monitoring perovskite formation and related layers in-situ and in-line. Reflectance spectroscopy allows to assess film thickness, roughness, band gap and many more parameters. Photoluminescence provides further insights about composition and lifetime. All methods can be combined freely in one system; Eddy-current can be added for sheet resistance measurements. In-situ monitoring allows for understanding 100% of the process; in-line monitoring allows for 100% production control.
