By BaySpec, Inc
Raman spectroscopy has proven to be one of the most effective tools for characterization of semiconductor properties and for manufacturing process/quality control because materials such as Si, SiGe, InGaAs, GaAs, GaN, and graphene exhibit precise, distinct Raman bands. Applied in a microscopic approach, the Raman technique has been successfully implemented to determine microstructure composition on thin-films, strain in the multilayer device, and to identify defects across the wafer surface.
Breeze™ – Handheld Spectrometers Family Browse Breeze™ – Handheld Spectrometers Family Products Breeze™ – Handheld Spectrometers Breeze™ - IS Handheld VIS-NIR-SWIR Spectrometer
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Don't Wait for Answers Portability™ Transportable Mass Spectrometer
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BaySpec offers wide range of spectrometers from miniature handheld VIS – NIR - SWIR spectrometers, high-sensitivity UV – VIS – NIR – SWIR spectrometers, and CCD / InGaAs cameras. They are designed to meet real-world challenges for best-in-class performance, long-term reliability, compact size, and ultra-low power consumption. All these products provide fully customized OEM and ODM service to meet your spectroscopic needs. Browse Spectrometers Products - Breeze™ - Handheld Spectrometers Family - SuperGamut™ Spectrometers - SERS (Surface Enhanced Raman Scattering) - DeepView™ OCT Spectrographs - Nunavut™ Cameras
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Optical Telecom Browse Optical Telecom Products Erbium-doped Fiber Amplifiers (EDFA) Optical Channel Performance Monitors (OCPM, OCM, OPM) Optical Channel Performance Monitors (OCPM, OCM, OPM) – Wideband Optical Spectrum Analyzer – C/L band Optical Spectrum Analyzer – CWDM Optical Spectrum Analyzer – Wideband
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