Application: Force Modulation Mode, Pulsed Force Mode (PFM) Coating: Diamond-Like-Carbon coating on the tip side of the cantilever, 15 nm thick; Aluminum reflex coating on detector side of the cantilever, 30 nm thick The AFM Probe is micromachined, made of monolithic Silicon, exhibiting excellent uniformity and a sharp tip radius. The consistent tip radius of less than 15 nm gives good resolution and reproducibility. This probe uses an "on scan angle" symmetric tip to provide a more symmetric representation of features over 200 nm. The AFM Probe Holder Chip has alignment grooves on the backside and fits most commercial AFMs as it is industry standard size. Chip size: 3.4 x 1.6 x 0.3 mm Technical Data: Resonance Frequency: 75 kHz ± 15 kHz Force Constant: 3 N/m, 1 to 7 N/m Length: 225 μm ± 10 μm Mean Width: 28 μm ± 5 μm Thickness: 3 μm ± 1 μm Tip Height: 17 μm ± 2 μm Tip Setback: 15 μm ± 5 μm Tip Radius: < 15 nm Half Cone Angles: 20°-25° along cantilever axis; 25°-30° from side; 10° at the apex
AIO-DD Also known as All-In-One-DD Multipurpose AFM Probe with 4 Different Cantilevers and Conductive Diamond Tip Coating AFM Probe Specifications: AFM Tip Shape: Rotated Height: 17 µm (15 - 19 µm) Setback: 15 µm (10 - 20 µm) Radius: < 250 nm Half Cone Angle: 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex 4 AFM Cantilevers Cantilever A - Contact Mode Shape: Beam Force Constant: 0.5 N/m (0.2 - 0.9 N/m) Resonance Frequency: 19 kHz (16 - 24 kHz) Length: 500 µm (490 - 510 µm) Width: 30 µm (25 - 35 µm) Thickness: 2.7 µm (1.7 - 3.7 µm) Cantilever B - Force Modulation Shape: Beam Force Constant: 6.5 N/m (3 - 12 N/m) Resonance Frequency: 110 kHz (80 - 140 kHz) Length: 210 µm (200 - 220 µm) Width: 30 µm (25 - 35 µm) Thickness: 2.7 µm (1.7 - 3.7 µm) Cantilever C - Soft Tapping Shape: Beam Force Constant: 18 N/m (8 - 35 N/m) Resonance Frequency: 200 kHz (140 - 260 kHz) Length: 150 µm (140 - 160 µm) Width: 30 µm (25 - 35 µm) Thickness: 2.7 µm (1.7 - 3.7 µm) Cantilever D - Tapping Mode Shape: Beam Force Constant: 100 N/m (48 - 190 N/m) Resonance Frequency: 450 kHz (230 - 600 kHz) Length: 100 µm (90 - 110 µm) Width: 50 µm (45 - 55 µm) Thickness: 2.7 µm (1.7 - 3.7 µm) typical range Coating Boron doped polycrystalline diamond tip coating, 100 nm thick; Aluminum coating on detector side of the cantilever, 30 nm thick. Alignment Grooves none Additional Info Versatile monolithic silicon AFM probe with 4 different AFM cantilevers on a single AFM holder chip for various applications: contact mode, force modulation mode, soft tapping mode and high frequency tapping / non-contact mode and electric modes such as: scanning capacitance microscopy (SCM), electrostatic force microscopy (EFM), Kelvin probe force microscopy (KFM), scanning probe lithography and conductive atomic force microscopy (C-AFM). The doped polycristalling diamond AFM tip coating provides unprecedented hardness and durability, as well as electridcal conductivity for demanding electrical applications. The resulting AFM tip radius is in the range 100-250nm. The rotated AFM tips allow for more symmetric representation of high sample features. The AFM holder chip fits most commercial AFM systems as it is industry standard size. The main advantage of this product compared to regular, single-cantilever AFM probes is the freedom to choose the right AFM cantilever for each application in the very last moment. You do not need to stock various AFM probe types any more. Nevertheless, this product is not meant as a substitution to comparable single-cantilever AFM probes, because the geometry of each one of the All-In-One AFM cantilevers differs from the geometry of the comparable specialized single-cantilever AFM probes. Please note that the aluminum back side coating is not suitable for measurements in liquids! Consistent high quality at a lower price! Order Codes: AIO-DD-5 (5 per set), AIO-DD-10 (10 per set), AIO-DD-20 (20 per set), AIO-DD-50 (50 per set)
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Also known as ElectriAll-In-One Multipurpose AFM Probe with 4 Different Cantilevers and Platinum Overall Coating Order Code / Price: AIOE-10 (10 per set) 280.00 USD; AIOE-50 (50 per set) 1 200.00 USD. Does not include VAT or customs duties. AFM Tip: Shape: Rotated Height: 17 µm (15 - 19 µm) Setback: 15 µm (10 - 20 µm) Radius: < 25 nm Half Cone Angle: 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex 4 AFM Cantilevers: Cantilever A - Contact Mode: Shape Beam; Force Constant 0.2 N/m (0.04 - 0.7 N/m); Resonance Frequency 15 kHz (10 - 20 kHz); Length 500 µm (490 - 510 µm); Width 30 µm (25 - 35 µm); Thickness 2.7 µm (1.7 - 3.7 µm) Cantilever B - Force Modulation: Shape Beam; Force Constant 2.7 N/m (0.4 - 10 N/m); Resonance Frequency 80 kHz (50 - 110 kHz); Length 210 µm (200 - 220 µm); Width 30 µm (25 - 35 µm); Thickness 2.7 µm (1.7 - 3.7 µm) Cantilever C - Soft Tapping: Shape Beam; Force Constant 7.4 N/m (1 - 29 N/m); Resonance Frequency 150 kHz (70 - 230 kHz); Length 150 µm (140 - 160 µm); Width 30 µm (25 - 35 µm); Thickness 2.7 µm (1.7 - 3.7 µm) Cantilever D - Tapping Mode: Shape Beam; Force Constant 40 N/m (7 - 160 N/m); Resonance Frequency 350 kHz (200 - 500 kHz); Length 100 µm (90 - 110 µm); Width 50 µm (45 - 55 µm); Thickness 2.7 µm (1.7 - 3.7 µm) typical range Coating: Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever. Alignment Grooves: none Additional Info: Versatile monolithic silicon AFM probe with 4 different platinum coated AFM cantilevers on a single AFM holder chip for various applications: contact mode, force modulation mode, soft tapping mode and high frequency tapping / non-contact mode and electric modes such as: - scanning capacitance microscopy (SCM) - electrostatic force microscopy (EFM) - Kelvin probe force microscopy (KFM) The rotated AFM tips allow for more symmetric representation of high sample features. The consistent AFM tip radii ensure good resolution and reproducibility. The AFM holder chip fits most commercial AFM systems as it is industry standard size. The main advantage of this product compared to regular, single-cantilever AFM probes is the freedom to choose in the very last moment the right AFM cantilever for each application. You dont need to stock various AFM Probe types any more. Nevertheless, this product is not meant as a substitution to comparable single-cantilever AFM probes, because the geometry of each one of the ElectriAll-In-One AFM cantilevers differs from the geometry of comparable specialized single-cantilever AFM probes. BudgetSensors offers consistent high quality at a lower price!
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Also known as All-In-One-DLC Multipurpose AFM Probe with 4 Different Cantilevers and Diamond-Like-Carbon Tip Coating AFM Probe Specifications: AFM Tip Shape: Rotated Height: 17 µm (15 - 19 µm) Setback: 15 µm (10 - 20 µm) Radius: < 15 nm Half Cone Angle: 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex 4 AFM Cantilevers Cantilever A - Contact Mode Shape Beam Force Constant 0.2 N/m (0.04 - 0.7 N/m) Resonance Frequency 15 kHz (10 - 20 kHz) Length 500 µm (490 - 510 µm) Width 30 µm (25 - 35 µm) Thickness 2.7 µm (1.7 - 3.7 µm) Cantilever B - Force Modulation Shape Beam Force Constant 2.7 N/m (0.4 - 10 N/m) Resonance Frequency 80 kHz (50 - 110 kHz) Length 200 µm (200 - 220 µm) Width 30 µm (25 - 35 µm) Thickness 2.7 µm (1.7 - 3.7 µm) Cantilever C - Soft Tapping Shape Beam Force Constant 7.4 N/m (1 - 29 N/m) Resonance Frequency 150 kHz (70 - 230 kHz) Length 150 µm (140 - 160 µm) Width 30 µm (25 - 35 µm) Thickness 2.7 µm (1.7 - 3.7 µm) Cantilever D - Tapping Mode Shape Beam Force Constant 40 N/m (7 - 160 N/m) Resonance Frequency 350 kHz (200 - 500 kHz) Length 100 µm (90 - 110 µm) Width 50 µm (45 - 55 µm) Thickness 2.7 µm (1.7 - 3.7 µm) typical range Coating Diamond-Like-Carbon coating on tip side of the cantilever, 15nm thick; Aluminum coating on detector side of the cantilever, 30 nm thick Alignment Grooves none Additional Info Versatile silicon AFM probe with 4 different AFM cantilevers on a single AFM holder chip. Rotated, monolithic silicon AFM probe with symmetric tip shape for various applications (contact mode, force modulation mode, tapping mode and soft tapping mode). High durability and hydrophobicity due to Diamond-Like-Carbon coating on tip side of the AFM cantilever. The rotated AFM tips allow for more symmetric representation of high sample features. The consistent AFM tip radii ensure good resolution and reproducibility. The AFM holder chip fits most commercial AFM systems as it is industry standard size. The main advantage of this product compared to regular, single-cantilever AFM probes is the freedom to choose in the very last moment the right AFM cantilever for each application. You don't need to stock various AFM probe types any more. Nevertheless, this product is not meant as a substitution to comparable single-cantilever AFM probes, because the geometry of each one of the All-In-One cantilevers differs from the geometry of comparable specialized single-cantilever AFM probes. Please note that the aluminum back side coating is not suitable for measurements in liquids! Consistent high quality at a lower price!
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AIOAl Also known as All-In-One-Al Multipurpose AFM Probe with 4 Different Cantilevers and Aluminum Reflective Coating AFM Probe Specifications: AFM Tip Shape: Rotated Height: 17 µm (15 - 19 µm) Setback: 15 µm (10 - 20 µm) Radius: < 10 nm Half Cone Angle: 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex 4 AFM Cantilevers Cantilever A - Contact Mode Shape: Beam Force Constant: 0.2 N/m (0.04 - 0.7 N/m) Resonance Frequency: 15 kHz (10 - 20 kHz) Length: 500 µm (490 - 510 µm) Width: 30 µm (25 - 35 µm) Thickness: 2.7 µm (1.7 - 3.7 µm) Cantilever B - Force Modulation Shape: Beam Force Constant: 2.7 N/m (0.4 - 10 N/m) Resonance Frequency: 80 kHz (50 - 110 kHz) Length: 210 µm (200 - 220 µm) Width: 30 µm (25 - 35 µm) Thickness: 2.7 µm (1.7 - 3.7 µm) Cantilever C - Soft Tapping Shape: Beam Force Constant: 7.4 N/m (1 - 29 N/m) Resonance Frequency: 150 kHz (70 - 230 kHz) Length: 150 µm (140 - 160 µm) Width: 30 µm (25 - 35 µm) Thickness: 2.7 µm (1.7 - 3.7 µm) Cantilever D - Tapping Mode Shape: Beam Force Constant: 40 N/m (7 - 160 N/m) Resonance Frequency: 350 kHz (200 - 500 kHz) Length: 100 µm (90 - 110 µm) Width: 50 µm (45 - 55 µm) Thickness: 2.7 µm (1.7 - 3.7 µm) typical range Coating Aluminium reflex coating on detector side of the cantilever, 30 nm thick Alignment Grooves none Versatile monolithic silicon AFM probe with 4 different AFM cantilevers on a single AFM holder chip for various applications: contact mode, force modulation mode, soft tapping mode and high frequency tapping / non-contact mode. The rotated AFM tips allow for more symmetric representation of high sample features. The consistent AFM tip radii ensure good resolution and reproducibility. The AFM holder chip fits most commercial AFM systems as it is industry standard size. The main advantage of this product compared to regular, single-cantilever AFM probes is the freedom to choose in the very last moment the right AFM cantilever for each application. You do not need to stock various AFM Probe types any more. Nevertheless, this product is not meant as a substitution to comparable single-cantilever AFM probes, because the geometry of each one of the All-In-One AFM cantilevers differs from the geometry of comparable specialized single-cantilever AFM probes. Please note that the aluminum back side coating is not suitable for measurements in liquids! Consistent high quality at a lower price!
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