NW
Microscopy
MicroscopyInstrumentation

Piezoresponse Force Microscopy (PFM)

By NenoVision

PFM allows imaging of piezoelectric material domains. This method measures the mechanical response of the material to the applied alternating voltage together with topography.

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MountainsSPIP® software

Key features of MountainsSPIP® software: - Interactive particle analysis: detect, quantify, and classify structures of any shape and size. - Force curve and force volume image analysis: analyze force curves and force volume images with precision and ease. - Correlative analysis: seamlessly combine your AFM data with data from your SEM. - Multi-channel file analysis: easily handle and analyze multi-channel files, simplifying complex data processing. - Data enhancement: correct, normalize, and denoise your measured data to extract meaningful insights. - Accurate XY calibration: ensure precise XY calibration for precise measurements and analysis. - Tip effect correction: correct for tip effects to enhance the accuracy of your results. - Surface texture characterization: investigate surface texture in compliance with ISO standards.

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Magnetic-sensitive probe based on the Akiyama sensor, that can be used in SEM thanks to its visible tip. It uses the same probe holder as regular Akiyama. Measurement modes: Topography, MFM

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Our self-produced AFM probe with a conductive tip, capable of performing C-AFM, KPFM, PFM and I-V spectroscopy. Measurement modes: C-AFM, KPFM, PFM, I-V spectroscopy