Our Ultra-high Vacuum Scanning Kelvin Probe (UHVSKP2020) gives the user full access to work function (Φ) and contact potential difference (CPD) measurements under vacuum with the ability to scan asample area of 20 x 20 mm. Each system comes with the UHV head unit, tip amplifier (located at the mounting port), digital control unit and host PC with dedicat-ed software. The tip can be retracted 100 mm from the sample and approaches normal to the sample. The associated digital electronic unit powers the head unit and provides an interface between the head unit to the data acquisition system. The system comes with a user manual, which includes an introduction to work function measurements and a detailed description of the system software, including some examples. The work function resolution of the UHVSKP2020 is 1-3 meV. The software allows the user digital control of probe amplitude and frequency, mean-spac-ing and tip potential. There is also automatic measurement of the Kelvin probe signal, work function, signal and work function averaging as well as automatic control of tip to sample mean spacing. Other features include variable scan sizes and 3D charting of the work function data. The data generated can be easily exported to Excel-compatible or KP Wize spreadsheets for further processing. APPLICATIONS - Organic and non-organic semiconductors - Metals and metal alloys - Thin films and surface oxides - Solar cells and organic photovoltaics - Corrosion e.g. protection and resistance FEATURES - Work function resolution of 1-3 meV - SPV, SPS and APS options available - Gaseous or ambient measuring - Modular system for upgrades and add-ons - Automatic height regulation SYSTEM SPECIFICATIONS Tip material / diameter: 2 mm - 10 mm stainless steel tip Work function resolution: 1 - 3 meV Sample scanning: 20 x 20 mm stepper motor controlled Mounting geometry: Normal to sample surface Tip retraction: 50 mm - 100 mm Visualisation: 3D map of surface potential and sample topography Oscilloscope: Digital TFT oscilloscope for real time signal Step size: 2 μm (Z); 1.25 μm (X,Y) Tracking system: Automatic hold of tip-to-sample distance to 0.5 μm Detection system: Off-null with parasitic capacity rejection Mounting geometry: Normal to sample surface Mounting flange: DN63 (4.5") OD Vacuum compatibility: 2 x 10-11 mBar Digital control of: Tip amplitude, frequency, mean spacing and potential System includes: Set-up guide, cables and manual Averaging: Signal and work function Spare tip amplifier: Included Warranty: 12 months
The surface photovoltage spectroscopy modules are the perfect all-in-one solution for in-depth studies of light sensitive materials such as organic semiconductors, solar cells or light sensitive dyes. The modules offer a comprehensive range of measurement modes including DC and AC surface photovoltage studies utilising the built-in optical chopper. Total digital control of all parameters including light intensity and wavelength (400 - 700 nm: SPS030 or 400 - 1000 nm: SPS040) gives the opportunity to investigate and characterise the surface photovoltage and surface photovoltage spectroscopy properties of samples. The latest materials and applications highlighted in published papers includes, gold films, perovskite solar cells, titanium dioxide nanotubes, dye sensitised solar cells, hybrid organic/inorganic photocathodes and tungsten trioxide. Download the product brochure for more information on the Surface Photovoltage range, including technical specifications, example measurements and add-on options. - SPS030 - SPS040 - SPV020
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The surface photovoltage spectroscopy modules are the perfect all-in-one solution for in-depth studies of light sensitive materials such as organic semiconductors, solar cells or light sensitive dyes. The modules offer a comprehensive range of measurement modes including DC and AC surface photovoltage studies utilising the built-in optical chopper. Total digital control of all parameters including light intensity and wavelength (400 - 700 nm: SPS030 or 400 - 1000 nm: SPS040) gives the opportunity to investigate and characterise the surface photovoltage and surface photovoltage spectroscopy properties of samples. The latest materials and applications highlighted in published papers includes, gold films, perovskite solar cells, titanium dioxide nanotubes, dye sensitised solar cells, hybrid organic/inorganic photocathodes and tungsten trioxide. Download the product brochure for more information on the Surface Photovoltage range, including technical specifications, example measurements and add-on options.
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Specification - Tip material / diameter: 4 mm - 10 mm stainless steel tip (other diameters available) - Work function resolution: 1 - 3 meV - Standard translator: 50 mm manual translator - Motorised translator sizes: 50 mm or 100 mm manual translators - Height control (auto): Approximately 1 - 5 mm by DC offset (unless motorized) - Visualisation: Single-point work function/contact potential difference scans - Oscilloscope: Digital TFT oscilloscope for real time signal - Options: SPS/SPV/APS capabilities - Test sample: Available on request - Control supplied: USB control with dedicated software - Detection system: Off-null with parasitic capacity rejection - Mounting geometry: Normal to sample surface - Mounting port: DN40/CF70 (2.75 inch) OD - Vacuum compatibility: 2 x 10-11 mBar - Flange to sample distance: User defined - UHV cell: Not included - Warranty: 12 Months
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Specification Tip material / diameter: 2 mm stainless steel tip Work function resolution: 1 - 3 meV Sample scanning: 50 x 50 mm Relative humidity control: Automatic: 20 - 80% Atmospheric control: Oxygen <1% Optical system: Colour Camera Oscilloscope: Digital TFT oscilloscope for real time signal Test sample: Gold and aluminium sample Breadboard footprint: 900 x 600 mm Control supplied: PC with dedicated software Detection system: Off-null with parasitic capacity rejection Warranty: 12 Months
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