The Hummingbird Scientific TEM Biasing Nano-Manipulator Sample Holder enables site-specific nanomanipulation and electrical characterization during in-situ TEM and STEM experiments. Designed for researchers in semiconductor devices, nanotechnology, energy storage, materials science, electronics, and low-dimensional materials, it supports investigations of electrical transport, interface behavior, electrochemical reactions, device performance, nanowires, and 2D materials. By correlating localized electrical measurements with atomic-resolution imaging and analytical characterization, researchers can reveal the mechanisms governing electrical behavior, structural evolution, and device performance at the nanoscale. Hummingbird Advantages: * Precision movable probe for creating and repositioning site-specific electrical contacts with nanometer-scale positioning. * Independent X, Y, and Z probe motion for accurate, repeatable sample navigation. * Compatible with standard 3 mm half grids, FIB lift-out grids, and custom sample geometries. * Easily replace standard commercially available STM probes to support diverse experimental requirements. * Removable sample cartridge and dedicated setup block for simplified sample preparation and faster experiment setup. * Full compatibility with TEM, STEM, SAED, EDS, and EELS during electrical characterization experiments. Probe control Coarse thumb-screw motion; fine piezoelectric motion Coarse Movement Range, X axis >1000 µm Coarse Movement Range, Y/Z axes 500–1000 µm Fine Movement Range, X axis 2–3 µm Fine Movement Range, Y/Z axes ~40 µm Electrical Contacts 2 standard; 3–7 optional Electrical Measurement/Control Integrated voltage source meter Current Resolution Down to 1 pA (depending on the choice of electronics) Sample Compatibility 3 mm half grids; FIB lift-out grids; custom How it Works The TEM Biasing Nano-Manipulator Sample Holder combines a precision movable electrical probe, independent three-axis nanomanipulation, low-noise electrical connections, and an integrated source meter into a single platform for site-specific electrical characterization inside the TEM. Samples prepared on standard 3 mm half grids, FIB lift-out grids, or custom substrates are mounted in the removable sample cartridge using a dedicated setup block for accurate, repeatable assembly. The cartridge is then installed in the holder, automatically establishing electrical connections while leaving the measurement circuit open. During the experiment, the movable probe is positioned using uncoupled piezo-driven coarse and fine motion along the X, Y, and Z axes until it contacts the specimen, completing the electrical circuit under direct TEM observation. Hummingbird Control™ Software provides an intuitive graphical user interface for precise probe control with configurable step sizes and integrated motion compensation to simplify contact formation and optimize probe positioning. Once contact is established, researchers can apply electrical bias and acquire low-noise electrical measurements while simultaneously performing TEM/STEM imaging, electron diffraction, EDS, and EELS. The probe can be repositioned throughout the experiment to investigate multiple devices, interfaces, and regions within the same specimen, enabling flexible, site-specific electrical characterization in a single TEM session. Key Features and Capabilities Precision Movable Electrical Probe for Site-Specific Characterization Position a movable electrical probe using precise uncoupled X, Y, and Z motion for site-specific electrical characterization The TEM Biasing Nano-Manipulator Sample Holder features a precision movable electrical probe with independent coarse and piezo-driven fine motion along the X, Y, and Z axes for intuitive, high-precision positioning. Manual coarse motion provides >1000 μm travel in X and 500–1000 μm in Y and Z, while piezo-driven fine motion provides 2–3 μm travel in X, ~40 μm in Y and Z, and sub-nanometer positioning resolution for controlled probe approach and reliable electrical contact. The user-replaceable probe is available in tungsten, copper, and other materials to meet different experimental requirements. Together, these capabilities enable site-specific nanomanipulation and electrical biasing of individual devices, interfaces, defects, and other nanoscale features within a single in-situ TEM experiment. Benefits: › Perform site-specific electrical probing with nanometer-scale positioning precision › Adapt probe material and geometry to suit different specimens and electrical measurements › Optimize electrical contact under direct TEM observation for improved experimental success › Reposition the probe to investigate multiple devices, interfaces, and regions in a single experiment Stable Electrical Contacts for High-Resolution Imaging Preserve imaging stability while performing localized electrical measurements and analytical TEM characterization The holder is designed to maintain stable electrical contacts during in-situ experiments while preserving the mechanical stability required for high-resolution TEM, STEM, electron diffraction, EDS, EELS, and other analytical TEM techniques. This enables researchers to investigate electrical transport, contact formation, interface behavior, electrochemical processes, and device performance while directly correlating localized electrical measurements with structural, crystallographic, and chemical characterization from the same region of interest. Benefits: › Preserve high-resolution imaging while performing electrical measurements › Reduce imaging artifacts caused by unstable probe-sample contact › Improve measurement repeatability through stable, reliable electrical contacts › Correlate electrical behavior with structural, chemical, and crystallographic information Reliable Low-Noise Electrical Measurements Acquire repeatable low-noise electrical measurements for accurate characterization of nanoscale materials and devices The holder combines a stable movable electrical probe with low-noise electrical connections to enable reliable in-situ electrical characterization. The probe can repeatedly establish, maintain, and disengage electrical contact with selected nanoscale features, enabling repeatable electrical measurements while individually shielded coaxial connections preserve signal integrity for sensitive electrical characterization. Benefits: › Electrical biasing › Current measurement › Coaxial connections › Data plotting › Data recording Intuitive Hardware and Software Control Control probe positioning and electrical measurements through integrated hardware and intuitive software The holder is supplied with an integrated controller and Hummingbird Control™ Software for intuitive control of probe motion and electrical measurements. Piezo-driven fine motion is controlled using either the graphical interface or a joystick, with configurable movement direction and step size for precise probe positioning. An integrated compensation algorithm minimizes parasitic probe motion to simplify probe-to-sample contact, while the built-in source measure unit (SMU) enables I–V characterization, voltage sweeps, real-time current and voltage plotting, data recording, and data export from a single, unified interface. Benefits: › Intuitive control of probe positioning and electrical measurements › Simplify site-specific electrical contact formation › Automatically compensate for parasitic probe motion during fine positioning › Reduce workflow complexity for in-situ electrical measurements Precision Fixture for Sample Loading Simplify mounting of 3 mm half grids, FIB lift-out grids, and custom substrates with a dedicated sample loading fixture The holder comes with a dedicated sample loading fixture that securely holds the removable sample cartridge during specimen mounting. This provides a stable platform for accurately and repeatably mounting 3 mm half grids, FIB lift-out grids, and custom substrates. By improving mounting accuracy, repeatability, and setup speed, the fixture reduces the likelihood of sample damage and helps ensure consistent specimen preparation for in-situ TEM experiments. Benefits: › Improve mounting accuracy for 3 mm half grids, FIB lift-out grids, and custom substrates › Increase repeatability and speed of specimen mounting across experiments › Reduce the risk of sample damage during specimen mounting › Improve overall workflow efficiency and experiment reproducibility
