
By Deben UK Ltd
CT5000RT X-ray CT Tensile and Compression Stage A compact in-situ tensile and compression stage for X-ray CT and µXCT systems, enabling real-time 3D imaging of internal material behaviour during mechanical loading. CT5000RT – In-Situ Tensile & Compression Stage for X-ray CT In association with the major manufacturers µXCT systems including Zeiss, RX Solutions, Bruker, Tescan/XRE, Nikon, Sigray and Baker Hughes/Waygate we are now able to offer an integrated tensile testing solution for your µXCT application. Using tensile testing with µXCT provides a clear visual interpretation of how the properties of materials and composites change under different loading conditions. The compact design of these testing stages allow them to be used with the smallest high resolution micro CT systems providing a range of tensile and compression stages with forces up to 20kN and resolutions down to 25mN. Systems are controlled from the comprehensive MICROTEST tensile stage control software giving a wide range of control functions and a live display of load versus extension and supplied with all required cabling and mounting adaptors for specific µXCT systems. Further details and pricing is available from your micro CT supplier or direct from Deben. Suitable for: Semiconductors Life Sciences Soft Materials Raw Materials X-Ray Computed Tomography (XCT) Synchrotron Metallurgy Ceramics Electronics Features - X-ray CT tensile & compression testing stage - 5kN loadcell with linearity ±1% of full-scale range including loadcell exchange kit - Accuracy ±0.5%, dynamic resolution 1%, static resolution 0.05% of full-scale range - Extensometer for position readout, 300nm resolution - Maximum travel: 10mm, standard gauge length 10mm – 20mm tensile, 15mm – 5mm compression (different gauge lengths available upon request) - User exchangeable gearbox with speed range 1mm/min. to 1.0mm/min. - Simple specimen exchange mechanism with high strength vitreous glassy carbon support tube: 60mm OD, wall thickness 3mm, (6mm in beam path) - Tensile & compression jaws as well as compression plates - Maximum sample size: Compression: 39mm diameter x 50mm high; Tensile: 30mm long including 10mm clamping region at each end x 20mm wide x 5mm thick - Height to match X-ray source - Stage weight: 5kg approx - MICROTEST™ software control

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MT5000VT Variable Temperature Tensile and Compression Stage Microtest™ 5000N stages have been specifically designed to allow real time observation of the high stress region of a sample with an SEM, optical microscope, AFM or XRD system. The MT5000VT allows Temperature control of your sample from -20° C to +160°C. Microtest™ MT5000VT Variable Temperature Tensile and Compression Stage Microtest™ 5000N stages have been specifically designed to allow real time observation of the high stress region of a sample with an SEM, optical microscope, AFM or XRD system. With dual threaded leadscrews the centre of the specimen stays centrally located. Loadcells from 150N to 5000N cover most applications, with extension rates from 0.1mm/min to 15mm/min. All stages have linear scales for elongation measurement and optical encoders for speed control. Windows software sets drive parameters and displays the stress/strain curve live on the computer screen. Options include three and four point bending clamps, fibre clamps and microscope mounting adaptors. Special versions of the stage can be manufactured to customer requirements. Stages are controlled from our Microtest™ tensile testing software. The 5000N tensile stage uses miniature loadcells in the range 150N to 5000N. Samples are mounted horizontally, clamped to a pair of jaws and supported on stainless steel sliding bearings. A dual threaded leadscrew drives both jaws symmetrically in opposite directions, keeping the sample centered in the field of view. The 5000N module is ideally suited for use with an SEM, optical microscope, XRD or AFM and will easily fit on most stages. Travel is 10mm by default with 20mm optionally available. The MT5000VT allows Temperature control of your sample from -20° C to +160°C. Custom versions are available with heating/cooling, extended specimen length and stage travel. Suitable for: Light Microscopy X-Ray Diffraction Scanning Electron Microscopy (SEM) Semiconductors Life Sciences Soft Materials Atomic Force Microscopy Raw Materials Features - Extended MT5000 to incorporate Peltier sub-stage - 5kN loadcell, linearity ±1% of full-scale range - Accuracy ± 5%, dynamic resolution 0.1% static resolution 0.05% of full-scale range - Travel: 10mm, standard gauge length: 30mm – 40mm - Temperature range: -20°C to +160°C - Dimensions: 166mm x 108mm x 39mm (L, W, H) - Weight: 7kg approx. - MICROTEST™ software control
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