By NenoVision
NenoVision's AFM-in-SEM LiteScope is a unique tool for multimodal in-situ correlative sample analysis, offering a combination of Atomic Force Microscopy (AFM) integrated within a Scanning Electron Microscope (SEM). This innovative approach allows for simultaneous observation and measurement, facilitating a deeper understanding of material behaviors and characteristics that were previously challenging to achieve. Winning in the Analytical/Test category highlights the significant impact of NenoVision's AFM-in-SEM LiteScope technology, which has revolutionized how researchers and industry professionals analyze and understand complex materials at nanoscale.
Key features of MountainsSPIP® software: - Interactive particle analysis: detect, quantify, and classify structures of any shape and size. - Force curve and force volume image analysis: analyze force curves and force volume images with precision and ease. - Correlative analysis: seamlessly combine your AFM data with data from your SEM. - Multi-channel file analysis: easily handle and analyze multi-channel files, simplifying complex data processing. - Data enhancement: correct, normalize, and denoise your measured data to extract meaningful insights. - Accurate XY calibration: ensure precise XY calibration for precise measurements and analysis. - Tip effect correction: correct for tip effects to enhance the accuracy of your results. - Surface texture characterization: investigate surface texture in compliance with ISO standards.
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The go-to probe for CPEM measurements thanks to its visible tip. Capable of measuring AFM topography and energy dissipation signal at the same time. Measurement modes: Topography, Energy dissipation
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Magnetic-sensitive probe based on the Akiyama sensor, that can be used in SEM thanks to its visible tip. It uses the same probe holder as regular Akiyama. Measurement modes: Topography, MFM
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