The Hummingbird Scientific TEM Tomography Sample Holder enables high-tilt electron tomography, conventional TEM/STEM imaging, and correlative atom probe tomography (APT) using interchangeable sample tips for diverse specimen geometries. Designed for researchers in materials science, semiconductor devices, energy storage, catalysis, nanotechnology, and life sciences, it supports three-dimensional characterization of nanoparticles, battery materials, catalysts, biological specimens, FIB lift-out samples, and complex device architectures. By maximizing specimen tilt while minimizing drift and sample movement, researchers can generate high-fidelity 3D reconstructions and reveal buried interfaces, pore networks, and complex nanoscale structures with greater accuracy. Hummingbird Advantages: * Perform electron tomography, conventional TEM/STEM imaging, and correlative atom probe tomography (APT) using a single holder platform. * Configure the holder for 3 mm full grids, 3 mm half-grids, 1 mm grids, FIB lift-out specimens, APT needle specimens, microfabricated chips, and custom sample geometries using interchangeable sample tips. * Maximize accessible tilt angle and minimize missing wedge for high-fidelity three-dimensional tomographic reconstructions. * Minimize drift, sample runout, and settling time for reliable automated tilt-series acquisition. * Reveal buried interfaces, pore networks, device architectures, and other complex internal structures with high-fidelity 3D reconstruction. Removable Tips for Various Sample Substrates 3mm full and half grids, 1mm grids, single point, Hummingbird Scientific chips Tilt Range ±90° (depending on stage limits) Image Resolution Up to TEM resolution Available For: [image links not included] How it Works The TEM Tomography Sample Holder integrates interchangeable removable sample tips into a flexible platform for high angle single-tilt electron tomography, conventional TEM/STEM imaging, and correlative atom probe tomography (APT). Samples are mounted onto the removable tip best suited to the specimen geometry before the tip is inserted into the holder for imaging and tomography experiments. A range of removable tip configurations supports 3 mm and 1 mm grids, FIB lift-out specimens, APT needle specimens, microfabricated chips, and custom sample geometries. Each tip is designed to maximize accessible tilt while minimizing sample shadowing, helping researchers obtain higher-quality three-dimensional tomographic reconstructions. While specifically engineered for automated tilt-series acquisition and tomographic reconstruction workflows, the holder is also widely used as a general-purpose single-tilt holder thanks to its exceptional stability, ease of use, and compatibility with a wide range of sample substrates. The removable tips allow the same specimen to be transferred between TEM tomography and atom probe tomograpy (APT) mounting systems, enabling direct correlative three-dimensional characterization. Key Features and Capabilities Interchangeable Sample Tips for Diverse Specimen Geometries Configure the holder for virtually any tomography specimen using removable, application-specific sample tips The TEM Tomography Sample Holder features an interchangeable removable tip architecture that adapts a single holder to a wide range of specimen geometries and research workflows. Standard tip configurations support 3 mm full grids, 3 mm half-grids, 1 mm grids, FIB lift-out specimens, single-point needle specimens for atom probe tomography (APT), Hummingbird Scientific microfabricated chips, and custom sample geometries. This versatile removable-tip platform allows the holder to be optimized for virtually any tomography specimen and correlative characterization workflow. Benefits: › Compatible with a wide range of specimen geometries and sample preparation techniques › Simple, flexible sample loading and easy tip exchange › Optimize specimen mounting for maximum tilt and improved tomography reconstruction quality › Custom tip configurations available for specialized workflows Precision Fixtures for Sample Loading Simplify specimen mounting with dedicated fixtures that securely position removable sample tips during sample loading Dedicated flexures securely hold removable sample tips during loading of sample substrates, providing stable access under an optical microscope. The fixtures enable fast, accurate, and repeatable mounting of TEM grids, microfabricated chips, and other compatible sample substrates before insertion into the holder. Benefits: › Securely position removable sample tips during specimen loading › Improve mounting repeatability across multiple specimens and experiments › Reduce setup time with fast, simplified specimen loading › Reduce the risk of damaging delicate sample substrates during loading Correlative focused ion beam (FIB) and atom probe tomography (APT) workflow Directly mount compatible half-grid and single-point needle tips in FIB and CAMECA™ APT systems for efficient correlative characterization Our half-grid and single-point needle tips are specifically designed for correlative FIB, TEM, and atom probe tomography (APT) workflows. Their standardized shank geometry enables seamless transfer between FIB preparation stubs for APT needle fabrication, the TEM for high-resolution imaging and electron tomography, and standard CAMECA™ atom probe systems for three-dimensional atomic-scale compositional analysis. Using the same removable tip throughout the workflow preserves specimen orientation, minimizes handling, and enables direct correlation between structural and compositional datasets. Benefits: › Simplified APT sample preparation, transfer, and correlative characterization workflows › Increased throughput for multi-modal characterization › Purchase replacement and application-specific removable tips directly from our online store › Custom removable tip interfaces can be developed to match your APT mounting system Frequently Asked Questions What is the TEM Tomography Sample Holder? The TEM Tomography Sample Holder is a high-tilt single-tilt TEM sample holder designed for electron tomography, conventional TEM/STEM imaging, and correlative atom probe tomography (APT). Its interchangeable removable sample tips support a wide range of specimen geometries, including TEM grids, FIB lift-out specimens, APT needle specimens, microfabricated chips, and custom sample formats. The holder's ultra-stable mechanical design minimizes drift, sample runout, and settling time during tilting, enabling reliable automated tilt-series acquisition and high-fidelity three-dimensional reconstruction. Removable tips compatible with atom probe mounting systems also allow the same specimen to be transferred between TEM tomography and APT, supporting correlative three-dimensional characterization. What types of experiments can be performed with the TEM Tomography Sample Holder? The TEM Tomography Sample Holder supports a wide range of three-dimensional nanoscale characterization experiments using electron tomography. Researchers can reconstruct the internal morphology of nanoparticles, porous catalysts, battery materials, semiconductor devices, biological specimens, and other complex nanostructures that cannot be fully understood from conventional two-dimensional TEM images. The holder is also well suited for tomography of FIB lift-out specimens, enabling three-dimensional analysis of site-specific features such as buried interfaces, defects, voids, and device architectures. In addition to electron tomography, the same specimen can be characterized using conventional TEM/STEM imaging or transferred for correlative atom probe tomography (APT), providing complementary structural and compositional information across multiple microscopy techniques. What sample geometries and removable tips are available for the TEM Tomography Sample Holder? The TEM Tomography Sample Holder uses interchangeable removable sample tips to support a wide range of specimen geometries and experimental workflows. Standard tip configurations are available for 3 mm full TEM grids, 3 mm half-grids, 1 mm grids, FIB lift-out specimens, single-point needle specimens for atom probe tomography (APT), and Hummingbird Scientific's microfabricated chips. Custom removable tips can also be designed and manufactured to accommodate specialized sample geometries or unique research applications. This flexible tip architecture allows researchers to optimize specimen mounting for electron tomography, conventional TEM/STEM imaging, and correlative atom probe tomography using a single holder platform. How is the TEM Tomography Sample Holder different from a conventional TEM sample holder? Conventional TEM sample holders typically use a fixed sample tip and mounting geometry, limiting flexibility for different specimen types. Their bulky sample mounting mechanisms can reduce accessible tilt and increase sample shadowing, affecting the completeness and fidelity of three-dimensional reconstructions. They are also not designed to support seamless transfer of the same specimen between TEM and complementary techniques such as atom probe tomography (APT). The Hummingbird Scientific TEM Tomography Sample Holder addresses these challenges with interchangeable removable sample tips that support diverse specimen geometries while maximizing accessible tilt and minimizing the shadowed wedge to the detector that is typical of conventional TEM holders. Combined with exceptional mechanical stability, it enables high-fidelity three-dimensional reconstruction and direct correlative TEM and APT workflows using the same specimen. How does the TEM Tomography Sample Holder support correlative atom probe tomography (APT) workflows? The TEM Tomography Sample Holder uses interchangeable removable sample tips that are compatible with atom probe mounting, allowing the same specimen to be transferred directly between TEM and APT. Researchers can first perform conventional TEM/STEM imaging or high-tilt electron tomography to characterize the specimen's three-dimensional structure, then transfer the removable tip to an atom probe instrument for nanoscale compositional analysis. Using the same specimen throughout the workflow preserves specimen orientation, reduces handling, and enables direct correlation between three-dimensional structural information from TEM tomography and atomic-scale compositional data from APT. Why are low sample runout and high mechanical stability important for electron tomography? Electron tomography requires acquiring a large series of images as the specimen is tilted through many angles. If the specimen shifts during tilting (sample runout) or continues to drift after each tilt, the images become more difficult to align, increasing acquisition time and introducing reconstruction artifacts. The TEM Tomography Sample Holder minimizes sample runout, drift, and settling time, keeping the region of interest accurately positioned throughout the tilt series. This enables reliable automated tilt-series acquisition, improves image alignment, and produces higher-fidelity three-dimensional reconstructions. Can EDS and/or EELS be performed using the TEM Tomography Sample Holder? Yes. The TEM Tomography Sample Holder supports both energy-dispersive X-ray spectroscopy (EDS) and electron energy loss spectroscopy (EELS) during conventional TEM/STEM imaging and electron tomography experiments. Its high-tilt geometry and low-shadowing removable sample tips are designed to maximize X-ray collection efficiency while maintaining the specimen conditions required for high-quality EELS acquisition across a broad tilt range. These capabilities enable researchers to correlate three-dimensional structural information with elemental composition and chemical analysis for comprehensive nanoscale characterization.
