Our single-point Kelvin probe (KP020) system is the introductory system to the KP Technology Ltd range. The off-null signal detection method allows very high quality measurements of the work function ( Φ)and Fermi level of materials. The economical system enables users to quickly record single point data and the dedicated software allows full digital control of all parameters to match the exact requirements of the sample under investigation. The recorded data is easily exportable to analysis software. For rapid events, the KP020 can record work function at a rate of over 300 work function measurements per minute, or alternatively, the system will track slow work function evolution over a number of days. There is an in-built height regulation feature to control the tip to sample spacing during measurements which gives rise to stable, reliable and repeatable data. APPLICATIONS •Organic and non-organic semiconductors •Metals and metal alloys •Thin films and surface oxides •Nanotechnology •Corrosion •Solar cells and organic photovoltaics FEATURES •Work function measurement •Work function resolution of 1-3 meV •Manual X, Y, Z translator •Economical, entry system •Off-null signal detection system UPGRADES AND ADD-ONS •Scanning Kelvin Probe system •Ambient-pressure Photoemission Spectroscopy •Sample heater to 250°C •Surface Photovoltage Spectroscopy (400-1000nm) •Surface Photovoltage (QTH or LED) SYSTEM SPECIFICATIONS Kelvin Probe Tip material/diameter: Standard 2 mm Au plated tip Work function resolution: 1 - 3 meV Probe translation: 25 mm high resolution manual translator Visualisation: Single-point work function/contact potential difference measurement Oscilloscope: Digital TFT oscilloscope for real time signal Test sample: Au / Al Reference sample Control supplied: PC control with dedicated software for full digital control of all parameters Height regulation: Through automatic DC probe adjustments Detection system: Off-null with parasitic capacity rejection Faraday/optical enclosure: LE450 (450 mm x 450 mm) Optical system: Colour camera with zoom lens and monitor Warranty: 12 Months
The surface photovoltage spectroscopy modules are the perfect all-in-one solution for in-depth studies of light sensitive materials such as organic semiconductors, solar cells or light sensitive dyes. The modules offer a comprehensive range of measurement modes including DC and AC surface photovoltage studies utilising the built-in optical chopper. Total digital control of all parameters including light intensity and wavelength (400 - 700 nm: SPS030 or 400 - 1000 nm: SPS040) gives the opportunity to investigate and characterise the surface photovoltage and surface photovoltage spectroscopy properties of samples. The latest materials and applications highlighted in published papers includes, gold films, perovskite solar cells, titanium dioxide nanotubes, dye sensitised solar cells, hybrid organic/inorganic photocathodes and tungsten trioxide. Download the product brochure for more information on the Surface Photovoltage range, including technical specifications, example measurements and add-on options. - SPS030 - SPS040 - SPV020
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The surface photovoltage spectroscopy modules are the perfect all-in-one solution for in-depth studies of light sensitive materials such as organic semiconductors, solar cells or light sensitive dyes. The modules offer a comprehensive range of measurement modes including DC and AC surface photovoltage studies utilising the built-in optical chopper. Total digital control of all parameters including light intensity and wavelength (400 - 700 nm: SPS030 or 400 - 1000 nm: SPS040) gives the opportunity to investigate and characterise the surface photovoltage and surface photovoltage spectroscopy properties of samples. The latest materials and applications highlighted in published papers includes, gold films, perovskite solar cells, titanium dioxide nanotubes, dye sensitised solar cells, hybrid organic/inorganic photocathodes and tungsten trioxide. Download the product brochure for more information on the Surface Photovoltage range, including technical specifications, example measurements and add-on options.
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Specification - Tip material / diameter: 4 mm - 10 mm stainless steel tip (other diameters available) - Work function resolution: 1 - 3 meV - Standard translator: 50 mm manual translator - Motorised translator sizes: 50 mm or 100 mm manual translators - Height control (auto): Approximately 1 - 5 mm by DC offset (unless motorized) - Visualisation: Single-point work function/contact potential difference scans - Oscilloscope: Digital TFT oscilloscope for real time signal - Options: SPS/SPV/APS capabilities - Test sample: Available on request - Control supplied: USB control with dedicated software - Detection system: Off-null with parasitic capacity rejection - Mounting geometry: Normal to sample surface - Mounting port: DN40/CF70 (2.75 inch) OD - Vacuum compatibility: 2 x 10-11 mBar - Flange to sample distance: User defined - UHV cell: Not included - Warranty: 12 Months
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Specification Tip material / diameter: 2 mm stainless steel tip Work function resolution: 1 - 3 meV Sample scanning: 50 x 50 mm Relative humidity control: Automatic: 20 - 80% Atmospheric control: Oxygen <1% Optical system: Colour Camera Oscilloscope: Digital TFT oscilloscope for real time signal Test sample: Gold and aluminium sample Breadboard footprint: 900 x 600 mm Control supplied: PC with dedicated software Detection system: Off-null with parasitic capacity rejection Warranty: 12 Months
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