On-Axis Rotation Tomography Holder Accepts either rod- or cone-shaped specimens and rotates them fully through 360º about the axis of the holder. Allows 360° image acquisition and tomographic reconstruction without the loss of information due to the missing wedge. Single-axis tomography typically results in a missing wedge of information and dual-axis tomography results in a missing pyramid of information. On-axis rotation tomography yields results without the loss of any information, thus providing the maximum achievable amount of data from the specimen. The On-Axis Rotation Tomography Holder features a cylindrical specimen cartridge into which a specimen post is inserted. Specimen posts are available in a diameter of either 1.8 mm to accept common atom probe field ion microscope (APFIM) specimen mounts or 1 mm to accept focused ion beam (FIB) prepared specimens. FIB lift-out techniques are used to transport and attach a thick specimen to the tip of the specimen post. Then the specimen is further FIB-milled into a rod or cone shape and to electron transparency. The specimen post is clamped into the specimen cartridge. The specimen cartridge precisely fits within the body of the holder and is accurately aligned with the eucentric plane of the microscope. The cartridge is rigidly affixed to a mechanism that both moves along and rotates about the axis of the holder. A dedicated loading station facilitates the positioning of the cartridge into the holder. Once the On-Axis Rotation Tomography Holder is removed from its loading station, the cartridge is mechanically interlocked into the holder. Initially, the specimen can be fully rotated through 360° to select the proper specimen orientation. A stop is then engaged, which fixes the continuous rotation of the specimen with respect to the holder. A three-position precision indexing mechanism provides the means to orient the specimen in 120° increments. At each increment, while keeping the specimen position fixed with respect to the holder, the microscope’s goniometer is tilted to ±60° to acquire a tomographic tilt series. Indexing the rotation of the specimen by 120° two more times, combined with the ±60° goniometer tilt, yields data corresponding to 360° of specimen rotation. This procedure maximizes the amount of tomographic data obtained from a single specimen. Included with the holder are a holder loading stand, a Model 9010 Vacuum Storage Container, a cartridge loading station, 1.8 mm and 1 mm cartridges, 1 mm sample posts (pack of 10), FIB stub assembly, and two types of tweezers (Dumont #3 and Dumont 2E1/8). - Ideal for specimens prepared by a focused ion beam (FIB) tool - Ideal for atom probe tomography (APT) and field ion microscopy (FIM) specimens - Three-position index allows precise axial rotation of the specimen - Compatible with all pole-piece gap geometries - Is compatible with the microscope’s touch alarm, which stops goniometer movement in the event that a pole touch occurs Available for both JEOL and Thermo Fisher Scientific microscopes.
Includes all the components required to produce high quality cross-section specimens for transmission electron microscopy. Widely used cross-section specimens include semiconductor devices (which often have multiple layers and, thus, multiple interfaces), specimens with thin film layers, and composite materials. For the study of interfaces by transmission electron microscopy, it is critical to align the interface of interest parallel to the incident electron beam. One method for preparing such samples is to fabricate cross-section specimens. - Stacks and holds cross-section specimens - Aligns areas and interface of interest - Produces consistent glue layer thickness - Resulting stacks are readily cut by the Model 170 Ultrasonic Disk Cutter - Fabricate self-supported 3 mm diameter disk specimens
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Specimen Grinder. Mechanically prethins specimens for transmission electron microscopy. Produces uniform thickness specimens with parallel sides. Greatly reduces the time spent during the final preparation process of ion beam milling. For transmission electron microscopy, the quality of the initial disk determines the quality of the final specimen. The disk can be mechanically ground using the Model 160 Specimen Grinder to a precisely controlled thickness. Use the Model 200 Dimpling Grinder for final thinning. - Accurate and dependable - Precisely controlled - Specimens up to 18 mm diameter - No additional force needed - Large diameter provides excellent stability - Platen transferable to the Model 200 Dimpling Grinder
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Ultra-Narrow Gap Tomography Holder. A holder capable of tilting up to 90° while providing a maximized field of view for transmission electron microscopy. The Model 2030 Ultra-Narrow Gap Tomography Holder is capable of tilting up to 90° while providing a maximized field of view. The holder is suitable for ultra-narrow gap (< 3 mm) pole-piece geometries. The Ultra-Narrow Gap Tomography Holder accepts a 1.5 mm square or round TEM specimen or grid into a cartridge, securing it with a single clamp. Items included are a specimen loading stand, a Model 9010 Vacuum Storage Container, a loading fixture, a clamp tightening tool, copper grids, tweezers, and a spare parts kit. The holder: - Specimen loading station allows easy positioning and clamping of the specimen into the cartridge - Has a streamlined specimen clamping mechanism eliminates the shadowing associated with most holders at high-tilt angles - Has a retractable clamp that evenly distributes force on the specimen - Accommodates specimen thicknesses up to 100 μm - Is compatible with the TEM’s touch alarm, which stops goniometer movement in the event that a pole touch occurs The holder is available for both JEOL and Thermo Fisher Scientific microscopes.
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Produces high quality disk specimens from thin metal foils. A precision ground punch and die plate eliminate specimen stress and distortion. An ideal accessory to the Model 110 Automatic Twin-Jet Electropolisher. The specimen punch is available with a standard base or with a wide base, which provides extra stability when producing thin foils. A precision ground punch and die plate eliminate specimen stress and distortion of the disk specimen. A spring-loaded return plunger keeps the disk specimen on the die plate surface for convenient handling. Available in standard sizes of 1 mm, 2.3 mm, and 3.0 mm; other sizes available upon request
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