In-situ nanoindentation module for AFM-in-SEM LiteScope

By NenoVision

Nanoindentation has become a standard quantitative method that enables to measure mechanical properties such as modulus and hardness using very small amounts of materials. A nanoindentation test is performed by applying a load to a sample in a highly controlled manner with a geometrically well-defined probe. This versatile technique only requires simple sample preparation and can measure properties of various materials ranging from hard superalloys to soft biomaterials. The Alemnis nanoindenter module is an optional accessory LiteScope, an atomic force microscope (AFM) designed for swift integration into scanning electron microscopes (SEM). The resulting combination of three complementary techniques enables micromechanical experiments to be performed while observing the specimen with a superb SEM magnification and analysing the indented specimen with sub-nanometre resolution using a LiteScope. This unique solution is designed for maximum versatility and enables a wide range of novel and complex applications. Key advantages of the 3in1 solution (SEM + AFM + nanoindenter): Nanoindenter module for LiteScope enables quantitative material analysis by SEM-assisted indentation. precise localization of nanostructures colocalization of related SEM techniques (EBSD, EDX etc.) Precision: pre-indentation area survey (roughness, tilt, cracks, impurities, etc.) observation of indentation after-effects (pile up, cracking, etc.) Accuracy: fast nanoindentation and AFM targeting using SEM easily repeatable localization of the same area Efficiency: