By Melbourne Centre for Nanofabrication
Through using the FIB-SEM at MCN which is fitted with Scanning Transmission Electron Microscopy (STEM) detectors, Dr. Glushenkov is able to select and study new electrode materials for Li-ion batteries. The unique capability of the FIB-SEM instrument available at MCN is its ability to perform scanning electron microscopy (SEM) and STEM on the same specimen simultaneously. This allows researchers to understand the morphology of materials, their structure and composition at the same time, without the need to use multiple instruments. In addition, the focused ion beam available on the instrument can precisely slice specimens when required. The team expects to apply the FIB–SEM instrument available at MCN to studying electrode materials not only for lithium-ion batteries but also for new, unconventional types of batteries.
