Our service lab analyzes for you surfaces and interfaces with modern methods, including SEM/EDX, XPS, AFM, profilometry, and ToF-SIMS. We advise you on analytical questions, as they are typically encountered in production, quality assurance, or research and development. For instance, we identify contaminations or film-forming impurities, and analyze adhesion or discoloring problems. Furthermore, we measure depth profiles by XPS or ToF-SIMS, perform particle analyses using SEM/EDX, and quantify chemical groups on surfaces.
