By Institut Catala de Nanociencia i Nanotecnologia (ICN2)
The Electron Microscopy Unit provides a comprehensive and versatile instrumentation to prepare, visualize and analyse a wide variety of samples by electron microscopy. Comprising a double-corrected (S)TEM with sub-Angstrom imaging resolution, a high resolution HR(S)TEM, an environmental SEM (ESEM), an extreme high resolution SEM (XHRSEM) and a focused ion beam scanning electron microscope (FIB-SEM), our state-of-the-art electron microscopes are capable of obtaining high resolution morphological, structural and elemental information of the samples. Besides, the Unit has the required set of tools (sputter coater, diamonds saws, precision polisher, ion mill, among others) to perform the appropriate preparation to the samples prior to their observation by electron microscopy.
