By Xenocs
SAXS relies on X-ray scattering to probe the nanostructure of materials. When X-rays interact with the sample, they scatter in various directions based on electron density fluctuations within the material. This implies that objects should present a sufficiently high electronic contrast with the surrounding continuous phase [8]. By measuring the intensity of scattered X-rays at small angles, SAXS provides information about particle size, shape, internal structure and aggregation state. Moreover, it can reveal pore size and size distribution, as well as shape determination, along with structural information ranging from sub-nanometer to micrometer scale. This is achieved through various angular ranges (wide, small, and ultra-small angles WAXS/SAXS/USAXS) and geometries (transmission or grazing incidence GISAXS) on both bulk samples and surfaces. SAXS, instead, offers higher resolution and the capability to discern multiple particle populations accurately. Moreover, SAXS is sensitive to particle shape and internal structure, offering detailed information about particle morphology. SAXS also provides more versatility for analyzing particles in various states (gel, solid, powder, liquid) whereas DLS is limited to particles in solution.
