By Wintech Nano-Technology Services Pte. Ltd.
Project introduction: The Hitachi SU5000 conventional scanning electron microscope creates a topography image of the surface by scanning the sample and collecting secondary electrons. Non-conductive samples can also be used with Hitachi SU5000, which introduces positively charged molecules into the surface attachment of the sample by adjusting the vacuum level of the SEM cavity. These molecules interact with the charging electrons and neutralize them, eliminating this charging effect. However, air molecules introduced in the vacuum chamber interact with primary electrons, reducing the quality of the image. Application advantages: Hitachi SU5000 has Schottky thermal field resolution, 3.0nm@1KV, magnification 10x~80kx, variable vacuum chamber 300pa, sample stage length, width and height 100*50*65mm, SE+BSE multi-probe use at the same time, adjust vacuum without gold sputtering, grinding IonMill preparation can be directly SEM, can do sample imaging photos, can not be gold plated samples can be directly SEM.
