By Wintech Nano-Technology Services Pte. Ltd.
Project introduction: The Hitachi SU8230 is a cold-field emission scanning electron microscope (FE-SEM) with ultra-high resolution that creates a topography image of a display surface by scanning a sample and using a special detector mobile phone to emit secondary electrons. Application advantages: Compared with the previous model, The resolution can reach 0.6nm，the probe current of SU8230 has been greatly improved, the current stability has been greatly enhanced, its stable beam can meet the analysis needs for a long time, and the extremely low landing voltage minimizes the damage of the electron beam to the sample surface, and realizes the continuous long-term high resolution and observation analysis capabilities. The cold field reduces electron beam carbon deposition pollution and has more surface topography information than TEM. Suitable for observing a single transistor, FA analysis is standard.
