By Attolight
In-SEM electrical probing, or nanoprobing, is a technique used to perform electrical characterization at the nanoscale within a scanning electron microscope (SEM). It involves using extremely fine, needle-like probes to measure and apply electrical signals to microstructures in devices like transistors, solar cells, and sensors. This method enables precise testing of materials, particularly in areas like optoelectronics, quantum technologies, and RF/power transistors. Nanoprobes are essential for detailed measurements such as resistivity, I-V curves, and EBIC/EBAC imaging, helping to advance research in microelectronics and novel materials development.
