By Center for Functional Nanomaterials Brookhaven
Contact: Dmytro Nykypanchuk and Oleg Gang In-situ structural characterization can be performed for surfaces, thin films nanoparticles, biological complexes, nanofabricated structures and hybrid composites under environmental condition. We utilize the range of x-ray (Rigaku Ultima III), optical (Ellipsometer J.A. Woollam M-2000, Dynamic Light Scattering with Zeta Potential - Malvern Zetasizer Nano), spectroscopic (Photon Counting Spectrofluorometer - ISS PC1/K2, Uv-Vis/NIR Spectrophotometer - PerkinElmer Lambda 950) and scanning probe methods (Asylum Research MFP-3D) for structure characterization.
