By Center for Functional Nanomaterials Brookhaven
Elmitec AC-LEEM aberration-corrected, spectroscopic low-energy electron microscope for high resolution spectro-microscopy of surfaces. Spatial resolution better than 3 nm in LEEM and 5 nm in XPEEM mode. Situated at the Electron Spectro-Microscopy (ESM) beamline at the NSLS-II. Micro- diffraction and micro-spectroscopy capabilities with photon energies from 15eV to 1500 eV. In-situ deposition and gas dosing capabilities. Can operate at variable temperatures (200 K to over 1700 K), and at pressures from UHV to 10-6 Torr. Elmitec LEEM V field-emission low-energy electron microscope for in-situ microscopy of dynamic surface processes. Micro-diffraction capability. Operation at variable temperature (200 K to over 1500 K), and at pressures from UHV to about 10-6 torr.
