By Advanced Optical Technologies
Achieving accurate control and measurements of optical scattering and polarization is a challenge documented in a large body of metrology literature. Actual scatter distributions are usually more complex than the predictions of simple parameter models, especially in their dependence on microstructure, wavelength, polarization, and other variables. Commercial polarization optics can vary by 5-10% from theoretical truths, introducing errors too large for demanding polarization devices and sensors. Part of this challenge stems from under-specification of the optical components (waveplates, polarizers, etc.) needed to make polarization measurements, which can be overcome by measuring and calibrating the full polarization signature, or Mueller matrix, of components with a sufficiently accurate Mueller-matrix polarimeter. AOT's calibration service can help you achieve the accuracy you need in your polarization device or sensor. Diffuse polarized reflectance can be measured to build accurate databases.
