By LayTec GmbH
In-situ and in-line metrology for film formation process control of perovskites and other emerging materials. LayTec offers metrology solution which are meant to accelerate both areas: Whilst in-situ methods can be used to obtain an improved understanding of the layer formation and degradation mechanisms in academic research, in-line metrology can support the scale-up by assessing the large area homogeneity of the layers as well as production yield. Due to similar deposition procedures, the same solution offered for perovskites can also be applied to organic PV materials and for those of hybrid materials. Features: Automated 24/7 in-line monitoring; MES communication of measurement results; In-situ determination of liquid and/or solid film thickness and bandgap; In-situ visualization of growth and formation kinetics; Spatially resolved in-line information about band gap, material composition and quality of the thin film material; Fast identification of faulty substrates before the cost-intensive back-end processing; Fast in-line measurement time of only 0.1 s; in-situ even shorter times can be realized; In-line measurement of the sheet resistance of conducting layers; Applicable to rigid (sheet-to-sheet) and flexible (roll-to-roll) configuration; Direct measurement of the charge carrier lifetime by time-resolved photoluminescence; Simultaneous in-situ measurement of the film thickness, bandgap and roughness. One particular advantage of perovskite processes lies in the low process temperatures, which allow for applying PL methods not only in-line but even in-situ. This allows unprecedented insights into the thin film formation processes, which are not available for high-temperature processes like CIGs or III-V epitaxy.
