By Institute of Physical Chemistry, Bulgarian Academy of Sciences
High Resolution Scanning Transmission electron microscope HR STEM JEOL JEM 2100 acceleration voltage 80 - 200 kV, maximum resolution – 0.23 nm between two points, maximum magnification 1500000x in conventional and 2000000x in scanning mode, with 5 basic regimes – bright field and dark field microscopy, diffraction from selected and nano sized area and diffraction in focused beam. Equipped with CCD camera GATAN Orius 832 SC1000 and GATAN Microscopy Suit Software.
