By Institute of Physical Chemistry, Bulgarian Academy of Sciences
X-ray diffraction apparatus for the study of thin films and nanostructures, specialized for the following methods: X-ray diffraction at a slight angle to the incident beam; measurements to determine the texture, including thin films and coatings; measurements for the determination of residual internal stresses; malkoaglovo scattering research of nanomaterials; X-ray reflectometry research on thin films and liquids; d iffraction of particulate and monolithic polycrystalline samples · plugins diffraction studies of fast processes including high temperature (up to 1600oS) and controlled environment.
