NW
Structural & Compositional AnalysisCharacterization & Testing

Focused Ion Beam Scanning Electron Microscope (FIB-SEM)

By Melbourne Centre for Nanofabrication

The team used MCN's Electron Beam Evaporation equipment to deposit the silver coating, before using the Centre's Focused Ion Beam Scanning Electron Microscope (FIB-SEM) to mill out the nanometre-sized crosses.