By Wintech Nano-Technology Services Pte. Ltd.
By detecting the very weak interatomic interaction force between the surface of the sample to be measured and the tiny probe, the surface morphology, structure and properties of the substance are studied. The instrument has extremely high resolution for the analysis of sample surface roughness, down to or near atomic level. In addition to this, atomic force microscopy can perform various quantitative analyses of materials in different modes. Main equipment advantages: - Minimum to 0.1nm depth resolution - A variety of application modules are expanded to meet different testing needs - Vacuum-adsorbed sample stage for measuring wafers up to 12 inches without destructive cutting - Tap mode test to accommodate flexible sample surfaces Test application introduction: - Surface imaging/surface roughness testing - Nanoindentation surface hardness analysis - Microcurrent leakage detection
