By Ebatco
With the addition of our Rigaku SmartLab X-ray Diffractometer, Ebatco can now offer a wide range of non-destructive, x-ray based characterization techniques. The Rigaku SmartLab X-ray Diffractometer is designed for quickly switching between parallel beam and Bragg-Brentano modes, allowing us to provide everything from high resolution single crystal measurements to powder diffraction services with a minimum of instrumental setup time. Several experimental methods are available, including X-Ray Diffraction, X-Ray Reflectivity, Powder Diffraction, and reflective Small Angle X-ray Scattering. Identification of unknown phases, determining lattice parameters of crystalline materials, measuring residual stress and strain, and thin film structural characterization are all possible with one machine. X-rays can be used to study the atomic scale structure of materials using the principles of diffraction. By scattering x-rays from a sample and measuring the intensity as a function of the scattering angle, it is possible to determine the distance between scattering objects. In X-Ray Diffraction (XRD), these are atomic planes in crystals, which can be used to identify the material, determine the atomic structure, or measure strain. In X-Ray Reflectivity (XRR) and small angle x-ray scattering, these distances measure the dimensions of thin films and nanoscale objects. Applications Alloys Ceramics Composition Analysis Concrete Crystallite Grain Size Epitaxy and Relaxation Film Thickness and Roughness Geological Samples Heterostructures and Superlattices Lattice Parameters Materials Science Metallurgy Nanomaterials Phase Identification Polymer Degree of Crystallinity Residual Stress Semiconductors Structure Determination Structure Mapping (XY Stage) Thin Films
