NW
Surface & Interface AnalysisCharacterization & Testing

X-ray photoelectron spectrometer AXIS Supra (Kratos Analytical Ltd)

By Institute of Physical Chemistry, Bulgarian Academy of Sciences

The apparatus is used for quantitative and qualitative chemical analysis of the uppermost atomic layers of solids surfaces by X-ray photoelectron spectroscopy (XPS). The AXIS Supra (Kratos Analitycal Ltd.) electron spectrometer has the following characteristics: - Monochromatic Al Kα and Ag Lα X -ray sources with photon energies of 1486.6 eV and 2984.3 eV, respectively; - Achromatic Al Kα and Mg Kα X -ray sources with photon energies of 1486.6 eV and 1253.6 eV; - Neutralization system against the surface charging due to electron photoemission; - Cleaning the sample surfaces using ion bombardment (with Ar + ions), followed by chemical analysis (depth profiling); - Analysis at different angles to the surface (only for atomic smooth surfaces); - Chemical imaging of the surfaces; - Software processing of the measured spectra using a company program ESCApe.