The Modified Transient Plane Source (MTPS) method developed by C-Therm provides the optimal choice for researchers in characterization the thermal conductivity of nanomaterials. Such materials are expensive and time-consuming to produce in the development phase. The MTPS has a small volume requirement of 1.5 mL, which is convenient for quick measurements, especially given the cost of large volumes of nanoparticles. The method’s simplicity allows researchers to quickly and easily characterize their samples, with no need for regression analysis. Additionally, the single-sided sensor is the only method that allows for the thermal mapping of a sample’s performance to better understand the dispersion of nanomaterials in a polymer matrix.
