By Northwestern University - NUANCE Center
Proprietary sensor design achieves closed-loop performance with open-loop noise levels for previously unseen resolution on a large-sample, tip-scanning AFM Significantly reduced noise floor enables imaging at atomic level in contact mode, with less than 30pm in Tapping Mode Drift rates less than 200pm per minute render distortion-free images Reduces occurrence of artifacts due to dull or broken probe tips Narrow trenches and pits cause problems for TappingMode due to excessive damping of the probe oscillation Peak Force Tapping is immune to these effects, easily reaching the bottom of these types of difficult features Contact Mode / Tapping Mode / Phase Imaging / HarmoniX Nanolithography and Nanomanipulation Force Volume Spectroscopy Piezoresponse Force Modulation Lateral Force Microscopy (LFM) Magnetic Force Microscopy (MFM) Electric Force Microscopy (EFM) Surface Potential Scanning Capacitance Microscopy (SCM) Scanning Spreading Resistance Microscopy (SSRM) Tunneling Atomic Force Microscopy (TUNA) Conductive Atomic Force Microscopy (CAFM) Torsional Resonance Mode (TRmode) TR-TUNA Dark Lift for TUNA
