By Institut Catala de Nanociencia i Nanotecnologia (ICN2)
The FEI Tecnai G 2 F20 is a 200kV field emission gun (FEG) high resolution and analytical TEM/STEM. It is ideal for applications requiring high coherency, high brightness at high magnification, or small focused probes. It is a versatile and flexible microscope and combines high performance in TEM and STEM modes with ease of operation in a multi-user research environment. Technical specifications - Acceleration voltages: 80, 120, 200 kV - Super Twin lens (point resolution: 0.24 nm; lattice resolution: 0.10 nm) - Sample holders: - single tilt (± 40º) - low background Be double tilt (± 40º) - and high tilt tomography (± 80º) - STEM unit with: - Off-axis HAADF detector - On-axis BF/DF2/DF4 detector - EDAX super ultra-thin window (SUTW) X-ray detector with 136 eV resolution (chemical analysis down to Be) - Gatan Imaging Filter (GIF) Quantum SE 963 fitted with a 2k x 2k CCD camera to produce energy filtered images (EFTEM), filtered diffraction patterns and EELS spectra - Gatan 2k x 2k US1000P CCD camera for HRTEM images - EDS and EELS spectrum imaging capabilities to produce line scans and elemental maps - Tomography: software for TEM and STEM acquisition ( Xplore3D ), alignment and reconstruction ( Inspect3D ) and visualisation ( ResolveRT ) - Low dose exposure technique - Photomontage - TrueImage for focal series acquisition and reconstruction Applications - High-resolution imaging, down to atomic scale, of the structure and morphology of samples in TEM and STEM modes up to 200kV operating voltage - Study of the crystal structure of materials using electron diffraction - Chemical analysis at nanometer level and chemical mapping via Energy Dispersive X-ray Spectroscopy (EDX), Electron Energy Loss Spectroscopy (EELS), and Energy Filtered TEM (EFTEM) - 3D reconstruction of structures by Electron Tomography - Study of beam sensitive samples using Low Dose
