Step Height Standards (SHS) are designed for X, Y, and Z calibration of scanning probe microscopes and profilometers. Our Step Height Standard features are available in two heights and are defined in thermally grown silicon dioxide on silicon substrate. A layer of Cr is deposited on the standard model to harden the surface.
Revolutionize your nanoscale thermal analysis with the award-winning VertiSense™ SThM module. This versatile plug-in integrates with most AFMs, offering unmatched ease of use. VertiSense™ boasts exceptional thermal resolution and sensitivity, allowing you to measure temperatures as low as -40 °C and as high as 700 °C with pinpoint accuracy. Explore various material properties with temperature and conductivity mapping modes, all under your control with the intuitive Bluetooth® wireless interface. Unveiling the thermal secrets of your samples has never been easier.
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