
By Deben UK Ltd
Microtest™ 2000N stages have been specifically designed to allow real time observation of the high stress region of a sample with an optical microscope, AFM or XRD system. The dual leadscrew stage has been designed to allow both transmitted and reflected illumination and can be fitted to an optical microscope, XRD system or Synchrotron. Supplied with feet the stage can stand vertically like a conventional tensile tester or with the feet removed it will sit flat on a bench or optical microscope stage. Versions with maximum loading to 2kN or 5kN are available, with optional loadcells of 500N and 1kN. Sample clamps are removable allowing easy customisation and the fitting of special clamps for different samples. We can supply fibre clamps, three and four point bending clamps and clamps to hold specifically shaped specimens. Optionally the stage can be supplied with temperature controllers and either heated or heated and cooled specimen clamps with a variable temperature range of -150˚C to 550˚C. Features - Horizontally or vertically mounted stage with void in rear for transmission observation - Precision slides with dual symmetrical stainless-steel leadscrews - 2kN loadcell, linearity ±1% of working range - Accuracy ±0.5%, dynamic resolution 1%, static resolution 0.05% of full-scale range - Extensometer for position readout, 300nm resolution - 20mm linear extensometer for position readout - Maximum travel 20mm, standard gauge length 20mm – 40mm between jaws - Maximum sample size 50mm x 15mm x 10mm (L, W, H) - Maximum Dimensions: 321mm x 162mm x 43mm (L, W, H) - Weight: 4kg approx. - MICROTEST™ software control Suitable for: Light Microscopy, X-Ray Diffraction, Semiconductors, Life Sciences, Soft Materials, Atomic Force Microscopy, Raw Materials

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CT5000RT X-ray CT Tensile and Compression Stage A compact in-situ tensile and compression stage for X-ray CT and µXCT systems, enabling real-time 3D imaging of internal material behaviour during mechanical loading. CT5000RT – In-Situ Tensile & Compression Stage for X-ray CT In association with the major manufacturers µXCT systems including Zeiss, RX Solutions, Bruker, Tescan/XRE, Nikon, Sigray and Baker Hughes/Waygate we are now able to offer an integrated tensile testing solution for your µXCT application. Using tensile testing with µXCT provides a clear visual interpretation of how the properties of materials and composites change under different loading conditions. The compact design of these testing stages allow them to be used with the smallest high resolution micro CT systems providing a range of tensile and compression stages with forces up to 20kN and resolutions down to 25mN. Systems are controlled from the comprehensive MICROTEST tensile stage control software giving a wide range of control functions and a live display of load versus extension and supplied with all required cabling and mounting adaptors for specific µXCT systems. Further details and pricing is available from your micro CT supplier or direct from Deben. Suitable for: Semiconductors Life Sciences Soft Materials Raw Materials X-Ray Computed Tomography (XCT) Synchrotron Metallurgy Ceramics Electronics Features - X-ray CT tensile & compression testing stage - 5kN loadcell with linearity ±1% of full-scale range including loadcell exchange kit - Accuracy ±0.5%, dynamic resolution 1%, static resolution 0.05% of full-scale range - Extensometer for position readout, 300nm resolution - Maximum travel: 10mm, standard gauge length 10mm – 20mm tensile, 15mm – 5mm compression (different gauge lengths available upon request) - User exchangeable gearbox with speed range 1mm/min. to 1.0mm/min. - Simple specimen exchange mechanism with high strength vitreous glassy carbon support tube: 60mm OD, wall thickness 3mm, (6mm in beam path) - Tensile & compression jaws as well as compression plates - Maximum sample size: Compression: 39mm diameter x 50mm high; Tensile: 30mm long including 10mm clamping region at each end x 20mm wide x 5mm thick - Height to match X-ray source - Stage weight: 5kg approx - MICROTEST™ software control
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